Title :
An efficient full-wave layered interconnect simulator (UA-FWLIS)
Author :
Wang, Xing ; Zhu, Zhaohui ; Dvorak, Steven L. ; Prince, John L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ, USA
Abstract :
In this paper, efficient analytical methods are used to implement a full-wave layered interconnect simulator (UA-FWLIS) that is based on the method of moments (MoM). In order to demonstrate these analytical techniques, we first developed a prototype simulator that could only handle thin, single-line stripline structures by modeling the current cells with filamentary expansion and test functions. However, the simple filamentary functions are not valid for modeling the coupling between multiple lines. Therefore, in this paper, we discuss the extension of UA-FWLIS to finite-width expansion and test functions so that it can accurately model complex, multiple-line structures. This paper describes how to extend the analytical analysis for computing the elements in the reaction (impedance) matrix from filamentary models to finite-width models. We then validate UA-FWLIS by comparing results with those obtained by Agilent Momentum for some stripline structures, including a single transmission line and a coupled-line bandpass filter. We then compare the computational efficiency of UA-FWLIS with Momentum.
Keywords :
band-pass filters; circuit simulation; coupled circuits; coupled transmission lines; impedance matrix; interconnections; method of moments; multiconductor transmission lines; network analysis; strip lines; transmission line matrix methods; MoM; UA-FWLIS; current cell modeling; filamentary expansion functions; finite-width test functions; full-wave layered interconnect simulator; impedance matrix; method of moments; multiple line coupling; multiple-line structures; reaction matrix; single transmission line; single-line stripline structures; stripline band-pass filter; Analytical models; Band pass filters; Computational efficiency; Couplings; Impedance; Moment methods; Stripline; Testing; Transmission line matrix methods; Virtual prototyping;
Conference_Titel :
Electronic Components and Technology Conference, 2004. Proceedings. 54th
Print_ISBN :
0-7803-8365-6
DOI :
10.1109/ECTC.2004.1319344