DocumentCode :
415977
Title :
Giga-hertz electrical characteristics of flip-chip BGA package exceeding 2,000 pin counts
Author :
Nakagawa, Kazuyuki ; Watanabe, Masaki ; Baba, Shinji ; Yamagishi, Keitaro ; Sasaki, Yuuichi ; Kamiyama, Tomoyuki ; Kimura, Michitaka
Author_Institution :
Renesas Technol. Corp., Hyogo, Japan
Volume :
1
fYear :
2004
fDate :
1-4 June 2004
Firstpage :
334
Abstract :
We have developed an FC-BGA (flip-chip BGA) package on a high-density organic substrate, achieving high pin count (exceeding 2,000 pins) and high speed operation. The data rate is over Gbit/s per channel, furthermore, the transmission rate continues increasing. In order to increase the rate per channel, differential signal transmission is normally adopted. But the eye opening becomes smaller and jitter becomes larger due to the transmission loss and the frequency response of the data pattern. Signals have wide bandwidth because the data pattern is at random. The Gbps transmission is achieved by decreasing the output jitter of the driver LSI, keeping the jitter tolerance in the unit interval (UI) of the receiver LSI and spreading the eye opening with reducing jitter. Also, it is necessary to supply stable power to control the plane resonance at the device activation frequency. In this study, we focused on the GHz electrical characteristics of system board and package to clarify the effect of the individual parts, by measurement and simulation, to realize the total model. The accurately constructed device model is very important over the GHz region for system level modeling.
Keywords :
ball grid arrays; circuit simulation; circuit stability; driver circuits; flip-chip devices; frequency response; integrated circuit measurement; integrated circuit modelling; integrated circuit packaging; jitter; FC-BGA; data pattern frequency response; differential signal transmission; driver LSI output jitter; eye opening; flip-chip BGA package; high pin count package; high-density organic substrate; power supply stability; receiver LSI unit interval jitter tolerance; transmission loss; Bandwidth; Electric variables; Frequency response; Jitter; Large scale integration; Packaging; Pins; Power supplies; Power system modeling; Propagation losses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2004. Proceedings. 54th
Print_ISBN :
0-7803-8365-6
Type :
conf
DOI :
10.1109/ECTC.2004.1319361
Filename :
1319361
Link To Document :
بازگشت