Title :
Manufacturability and reliability of fine pitch wirebonding
Author :
Aoki, Toyohiro ; Sauter, Wolfgang ; Hisada, Takashi
Author_Institution :
IBM Japan, Ltd., Shiga, Japan
Abstract :
Fine pitch wirebonding is driven by the need to make smaller die with a higher I/O count. The difficulty of deciding whether or not a fine pitch wirebond process can be considered manufacturable is addressed in this paper. An equation to measure this ´manufacturability´ is mathematically derived and employed. Experiments are performed to evaluate other effects that challenge fine pitch wirebonding.
Keywords :
fine-pitch technology; integrated circuit interconnections; integrated circuit reliability; lead bonding; fine pitch wirebonding; high I/O count small die; interconnection quality; wirebonding manufacturability measurement equation; wirebonding reliability; Bonding; Equations; Intermetallic; Manufacturing processes; Performance evaluation; Probes; Pulp manufacturing; Surface contamination; Very large scale integration; Wire;
Conference_Titel :
Electronic Components and Technology Conference, 2004. Proceedings. 54th
Print_ISBN :
0-7803-8365-6
DOI :
10.1109/ECTC.2004.1319367