Title :
Evaluation of Leakage Reduction Alternatives for Deep Submicron Dynamic Nonuniform Cache Architecture Caches
Author :
Bardine, Alessandro ; Comparetti, Manuel ; Foglia, Pierfrancesco ; Prete, C.A.
Author_Institution :
Dipt. di Ing. dell´Inf., Univ. di Pisa, Pisa, Italy
Abstract :
Wire delays and leakage energy consumption are both growing problems in designing large on-chip caches. Nonuniform cache architecture (NUCA) is a wire-delay aware design paradigm based on the sub-banking of a cache, which allows the banks closer to the controller to be accessed with reduced latencies with respect to the other banks. This feature is leveraged by dynamic NUCA (D-NUCA) caches via a migration mechanism which speeds up frequently used data access, further reducing the effect wire delays have on performance. To reduce leakage power consumption of static random access memory caches, various micro-architectural techniques have been proposed. In this brief, we compare the benefits and limits of the application of some of these techniques to a D-NUCA cache memory, and propose a novel hybrid scheme based on the Drowsy and Way Adaptable techniques. Such a scheme allows further improvement in leakage reduction and limits the impact of process variation on the effectiveness of the Drowsy technique.
Keywords :
SRAM chips; cache storage; integrated circuit design; D-NUCA cache memory; cache subbanking; deep-submicron dynamic nonuniform cache architecture; drowsy-way adaptable technique; dynamic NUCA caches; leakage energy consumption; leakage power consumption reduction; leakage reduction; leakage reduction alternatives; microarchitectural techniques; migration mechanism; on-chip caches; static random access memory caches; wire-delay aware design paradigm; Computer architecture; Energy consumption; Logic gates; Microprocessors; Optimized production technology; Random access memory; Wires; Leakage reduction techniques; nonuniform cache architecture (NUCA) cache; power consumption; wire delay;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2012.2231949