• DocumentCode
    416010
  • Title

    Advanced warpage prediction methodology for matrix stacked die BGA during assembly processes

  • Author

    Zhang, Xueren ; Tee, Tong Yan

  • Author_Institution
    STMicroelectronics, Singapore, Singapore
  • Volume
    1
  • fYear
    2004
  • fDate
    1-4 June 2004
  • Firstpage
    593
  • Abstract
    A comprehensive warpage analysis is performed on the matrix stacked die BGA (SDBGA) by means of finite element modeling, and experimental warpage measurements. By comparing the block warpage results from conventional linear small deformation simulation and the experimental measurement results, it is found that the linear method is not able to capture the warpage behavior of the SDBGA matrix, because the change of the centroidal moment of inertia of cross-section after deformation cannot be considered due to small deformation assumption. The nonlinear large deformation analysis must be taken instead. Base on the nonlinear analysis, an advanced warpage prediction methodology for matrix SDBGA is established. This methodology is then used to characterize the warpage behaviour of matrix SDBGA, and to study the different effects on the warpage. Warpage of matrix SDBGA during the whole assembly processes are also predicted. For the SDBGA matrix investigated, the crossbow dominant warpage and buckling phenomena are observed for the matrix after bottom die bonding and after interposer bonding, which are new findings in warpage study for electronic packages. It is also found that not only the total die length, but also the dice distribution will affect the warpage pattern of the matrix. For the matrix after top die bonding and after molding, normal warpage patterns are observed, i.e. both crossbow and coilset warpage are comparable. "Bending interaction" and the "warpage competition" mechanisms are proposed to explain the warpage characteristic for matrix SDBGA.
  • Keywords
    ball grid arrays; bending; buckling; circuit simulation; finite element analysis; integrated circuit measurement; integrated circuit modelling; integrated circuit packaging; microassembling; moulding; multichip modules; SDBGA matrix; assembly processes; bending interaction mechanisms; bottom die bonding; buckling phenomena; coilset warpage; cross-section centroidal moment of inertia; crossbow dominant warpage; dice distribution; electronic packages; finite element modeling; interposer bonding; linear small deformation simulation; matrix stacked die BGA; matrix warpage pattern; molding; nonlinear large deformation analysis; top die bonding; total die length; warpage analysis; warpage competition mechanisms; warpage measurements; warpage patterns; warpage prediction methodology; Assembly; Bonding; Electronics packaging; Finite element methods; Manufacturing; Microassembly; Performance analysis; Performance evaluation; Stacking; Strips;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2004. Proceedings. 54th
  • Print_ISBN
    0-7803-8365-6
  • Type

    conf

  • DOI
    10.1109/ECTC.2004.1319399
  • Filename
    1319399