Title :
Industrial experience with test generation languages gar processor verification
Author :
Behm, M. ; Ludden, J. ; Lichtenstein, Y. ; Rimon, M. ; Vinov, M.
Author_Institution :
IBM Development Center, Austin, Texas
Abstract :
We report on our experience with a new test generation language for processor verification. The verification of two superscalar multiprocessors is described and we show the ease of expressing complex verification tasks. The cost and benefit are demonstrated: training takes up to six months; the simulation time required for a desired level of coverage has decreased by a factor of twenty; the number of escape bugs has ken reduced.
Keywords :
Computer bugs; Graphical user interfaces; Hardware; Laboratories; Logic design; Permission; Power engineering and energy; Silicon; Testing; Time to market;
Conference_Titel :
Design Automation Conference, 2004. Proceedings. 41st
Conference_Location :
San Diego, CA, USA
Print_ISBN :
1-51183-828-8