DocumentCode :
416205
Title :
Industrial experience with test generation languages gar processor verification
Author :
Behm, M. ; Ludden, J. ; Lichtenstein, Y. ; Rimon, M. ; Vinov, M.
Author_Institution :
IBM Development Center, Austin, Texas
fYear :
2004
fDate :
7-11 July 2004
Firstpage :
36
Lastpage :
40
Abstract :
We report on our experience with a new test generation language for processor verification. The verification of two superscalar multiprocessors is described and we show the ease of expressing complex verification tasks. The cost and benefit are demonstrated: training takes up to six months; the simulation time required for a desired level of coverage has decreased by a factor of twenty; the number of escape bugs has ken reduced.
Keywords :
Computer bugs; Graphical user interfaces; Hardware; Laboratories; Logic design; Permission; Power engineering and energy; Silicon; Testing; Time to market;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2004. Proceedings. 41st
Conference_Location :
San Diego, CA, USA
ISSN :
0738-100X
Print_ISBN :
1-51183-828-8
Type :
conf
Filename :
1322433
Link To Document :
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