DocumentCode

416262

Title

Selective gate-length biasing for cost-effective runtime leakage control

Author

Gupta, Puneet ; Kahng, Andrew B. ; Sharma, Puneet ; Sylvester, Dennis

Author_Institution

University of California at San Diego

fYear

2004

fDate

7-11 July 2004

Firstpage

327

Lastpage

330

Keywords

Algorithm design and analysis; Circuits; Costs; Delay effects; Doping; Lithography; Permission; Process design; Pulp manufacturing; Runtime;

fLanguage

English

Publisher

ieee

Conference_Titel

Design Automation Conference, 2004. Proceedings. 41st

Conference_Location

San Diego, CA, USA

ISSN

0738-100X

Print_ISBN

1-51183-828-8

Type

conf

Filename

1322498