Title :
Defect tolerant probabilistic design paradigm for nanotechnologies
Author :
Jacorne, M. ; He, Chen ; De Veciana, Gustavo ; Bijansky, Stephen
Author_Institution :
The University of Texas at Austin
Keywords :
Computer aided manufacturing; Costs; Design methodology; Helium; Nanoelectronics; Nanoscale devices; Scalability; Self-assembly; Silicon; Uncertainty;
Conference_Titel :
Design Automation Conference, 2004. Proceedings. 41st
Conference_Location :
San Diego, CA, USA
Print_ISBN :
1-51183-828-8
