DocumentCode :
416363
Title :
A scalable soft spot analysis methodology for compound noise effects in nano-meter circuits
Author :
Zhao, Chong ; Bai, Xiaoliang ; Dey, Sujit
Author_Institution :
Univ. of California, San Diego, La Jolla, CA
fYear :
2004
fDate :
7-11 July 2004
Firstpage :
894
Lastpage :
899
Keywords :
Analytical models; Circuit noise; Crosstalk; Guidelines; Noise reduction; Protection; Scalability; Single event transient; System-on-a-chip; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2004. Proceedings. 41st
Conference_Location :
San Diego, CA, USA
ISSN :
0738-100X
Print_ISBN :
1-51183-828-8
Type :
conf
Filename :
1322610
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=416363
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