• DocumentCode
    416371
  • Title

    Scalable selector architecture for X-tolerant deterministic BIST

  • Author

    Wohl, Peter ; Waicukauski, John A. ; Patel, Sanjay

  • Author_Institution
    Synopsys Inc., Williston, VT
  • fYear
    2004
  • fDate
    7-11 July 2004
  • Firstpage
    934
  • Lastpage
    939
  • Keywords
    Automatic logic units; Automatic test pattern generation; Automatic testing; Built-in self-test; Circuit testing; Costs; Design for testability; Fault diagnosis; Logic testing; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2004. Proceedings. 41st
  • Conference_Location
    San Diego, CA, USA
  • ISSN
    0738-100X
  • Print_ISBN
    1-51183-828-8
  • Type

    conf

  • Filename
    1322618
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=416371