DocumentCode :
416371
Title :
Scalable selector architecture for X-tolerant deterministic BIST
Author :
Wohl, Peter ; Waicukauski, John A. ; Patel, Sanjay
Author_Institution :
Synopsys Inc., Williston, VT
fYear :
2004
fDate :
7-11 July 2004
Firstpage :
934
Lastpage :
939
Keywords :
Automatic logic units; Automatic test pattern generation; Automatic testing; Built-in self-test; Circuit testing; Costs; Design for testability; Fault diagnosis; Logic testing; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2004. Proceedings. 41st
Conference_Location :
San Diego, CA, USA
ISSN :
0738-100X
Print_ISBN :
1-51183-828-8
Type :
conf
Filename :
1322618
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=416371
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