DocumentCode
416372
Title
Scan-BIST based on transition probabilities
Author
Pomeranz, Kith
Author_Institution
Purdue University, W. Lafayette, IN
fYear
2004
fDate
7-11 July 2004
Firstpage
940
Lastpage
943
Keywords
Automatic testing; Benchmark testing; Built-in self-test; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Fault tolerance; Flip-flops; Logic testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2004. Proceedings. 41st
Conference_Location
San Diego, CA, USA
ISSN
0738-100X
Print_ISBN
1-51183-828-8
Type
conf
Filename
1322619
Link To Document