Title :
Pt-sheathed platinum resistance thermometer at the freezing point of copper
Author :
Arai, M. ; Kawata, A. ; Yamazawa, K.
Author_Institution :
Nat. Inst. of Adv. Ind. Sci. & Technol., Japan
Abstract :
The present status of a platinum sheath type high-temperature platinum resistance thermometer (Pt-sheathed HTPRT) is reported. The resistances of Pt-sheathed HTPRTs were measured at the freezing point of copper, which is higher than the upper temperature limit for a standard PRT defined in the ITS-90. The result showed that the resistance of the Pt-sheathed HTPRT was reproducible with a standard deviation of 4 mK at that temperature. This indicates that the thermometers developed are NOT contaminated by metal vapor, which is considered as the most serious problem for an SPRT for use at high temperatures.
Keywords :
annealing; copper; freezing; platinum; resistance thermometers; thermal resistance measurement; 4 mK; Cu; ITS-90; Pt; Pt-sheathed platinum resistance thermometer; annealing; copper freezing point; high temperature thermometer; metal vapor; resistance measurement; standard deviation; standard platinum resistance thermometer;
Conference_Titel :
SICE 2003 Annual Conference
Conference_Location :
Fukui, Japan
Print_ISBN :
0-7803-8352-4
