Title :
Nonlinearity characteristics of radiation thermometers
Author :
Ma, Laina ; Sakuma, Fumihiro
Author_Institution :
Nat. Metrol. Inst. of Japan, AIST, Tsukuba, Japan
Abstract :
Accurate calibration of radiation temperature requires knowledge of radiation thermometer nonlinearity. The nonlinearity at doubled incident radiation was measured at various radiance levels by using the dual aperture method. The scale deviation and uncertainty due to silicon detector nonlinearity were calculated. The expanded uncertainty due to the nonlinearity of a 0.65 /spl mu/m radiation thermometer scale was estimated as 0.04/spl deg/C at 2000/spl deg/C. The scale deviation of a 0.9 /spl mu/m radiation thermometer was 0.42/spl deg/C at 2000/spl deg/C.
Keywords :
calibration; elemental semiconductors; silicon; temperature measurement; thermometers; 0.04 degC; 0.42 degC; 0.65 micron; 0.9 micron; 2000 degC; Si; calibration; doubled incident radiation; dual aperture method; nonlinearity; nonlinearity characteristics; radiance levels; radiation temperature; radiation thermometers; scale deviation; scale uncertainty; silicon detector;
Conference_Titel :
SICE 2003 Annual Conference
Conference_Location :
Fukui, Japan
Print_ISBN :
0-7803-8352-4