Calibration and characterization of 900 nm silicon narrow-band radiation thermometers

This paper describes the calibration and characterization of the 900 nm standard radiation thermometers. Two methods are used for the calibration. One is the four fixed-point calibration and the other is the spectral responsivity calibration according to the ITS-90. Characterizations of the radiation thermometers for the size-of-source effect, distance effect, ambient temperature effect, zero offset, stability, are also shown.