Title :
Thermal analysis simulation using depolarization loss in solid-state microchip laser
Author :
Aoyagi, Y. ; Taira, Takunori ; Shoji, I.
Author_Institution :
Ind. Technol. Center of Fukui Prefecture, Japan
Abstract :
We have developed the analysis program based on a finite element (FE) method for the temperature distribution and thermally induced birefringence effect of the solid-state lasers. Numerical investigations for microchip laser have been carried out and evaluated with the measured depolarization losses, and we found that the errors between FE-based solutions and the measured values were less than 8%.
Keywords :
birefringence; finite element analysis; light polarisation; microchip lasers; temperature distribution; thermal analysis; FEM; depolarization loss; finite element method; solid state microchip laser; temperature distribution; thermal analysis simulation; thermally induced birefringence effect;
Conference_Titel :
SICE 2003 Annual Conference
Conference_Location :
Fukui, Japan
Print_ISBN :
0-7803-8352-4
