• DocumentCode
    417460
  • Title

    Probabilistic analysis for basis selection via ℓp diversity measures

  • Author

    Wipf, David P. ; Rao, Bhaskar D.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., California Univ., San Diego, La Jolla, CA, USA
  • Volume
    2
  • fYear
    2004
  • fDate
    17-21 May 2004
  • Abstract
    Finding sparse representations of signals is an important problem in many application domains. Unfortunately, when the signal dictionary is overcomplete, finding the sparsest representation is NP-hard without some prior knowledge of the solution. However, suppose that we have access to such information. Is it possible to demonstrate any performance bounds in this restricted setting? We examine this question with respect to algorithms that minimize general ℓp-norm-like diversity measures. Using randomized dictionaries, we analyze performance probabilistically under two conditions. First, when 0≤p≤1, we quantify (almost surely) the number and quality of every local minimum. Next, for the p=1 case, we extend the deterministic results of D.L. Donoho and M. Elad (see Proc. Nat. Acad. Sci., vol.100, no.5, 2003) by deriving explicit confidence intervals for a theoretical equivalence bound, under which the minimum ℓ1-norm solution is guaranteed to equal the maximally sparse solution. These results elucidate our previous empirical studies applying ℓp measures to basis selection tasks.
  • Keywords
    computational complexity; minimisation; signal representation; statistical analysis; NP-hard problem; basis selection; deterministic results; diversity measures; equivalence bound; explicit confidence intervals; minimization; probabilistic analysis; sparse signal representation; Application software; Dictionaries; Electric variables measurement; Linear programming; Performance analysis; Signal representations; Sparse matrices; Vectors; Veins;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Acoustics, Speech, and Signal Processing, 2004. Proceedings. (ICASSP '04). IEEE International Conference on
  • ISSN
    1520-6149
  • Print_ISBN
    0-7803-8484-9
  • Type

    conf

  • DOI
    10.1109/ICASSP.2004.1326379
  • Filename
    1326379