DocumentCode :
41772
Title :
On the Performance of Solution-Processable Random Network Carbon Nanotube Transistors: Unveiling the Role of Network Density and Metallic Tube Content
Author :
Qingqing Gong ; Bhatt, Vijay Deep ; Albert, Edgar ; Abdellah, Alaa ; Fabel, Bernhard ; Lugli, Paolo ; Scarpa, Giuseppe
Author_Institution :
Inst. for Nanoelectron., Tech. Univ. Munchen, Munich, Germany
Volume :
13
Issue :
6
fYear :
2014
fDate :
Nov. 2014
Firstpage :
1181
Lastpage :
1185
Abstract :
This paper reveals the influence of network density and metallic tube content on the performance of random network-based carbon nanotube field-effect transistors (CNTFETs) in terms of on-current, on/off ratio, and field-effect mobility. Network density and metallic tube content are two main design factors for random network-based CNTFETs besides variation of the device layout. We conducted a systematic study based on a set of more than 100 solution-processed back-gated CNTFETs with various network densities and metallic tube contents. The on-current and on/off ratio are found to be determined by the metallic tube density, a parameter defined as network density multiplying metallic tube content. The field-effect mobility has a curve shape varying with network density, while its amplitude is determined by metallic tube content of carbon nanotube (CNT) networks. Our results experimentally reveal the influence of those factors on transistor device performance, thus providing guidelines for design and optimization of random network-based CNTFETs, opening up new perspectives for printed electronics. In addition, a percolation model based on the Monte Carlo method was used for simulating the electrical characteristics of CNT devices, offering a basis for further device engineering.
Keywords :
Monte Carlo methods; carbon nanotube field effect transistors; C; CNTFET; Monte Carlo method; carbon nanotube field effect transistors; electrical characteristics; field-effect mobility; metallic tube content; metallic tube density; network density; on-current; on-off ratio; printed electronics; solution-processable random network; CNTFETs; Carbon nanotubes; Electron tubes; Logic gates; Performance evaluation; Suspensions; Carbon nanotube field-effect transistor (CNTFET); metallic tube content; network density; performance analysis; semiconductor-enriched carbon nanotubes;
fLanguage :
English
Journal_Title :
Nanotechnology, IEEE Transactions on
Publisher :
ieee
ISSN :
1536-125X
Type :
jour
DOI :
10.1109/TNANO.2014.2351011
Filename :
6882192
Link To Document :
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