Title :
Addressing static and dynamic errors in bandpass unit element multibit DAC´s
Author :
De Maeyer, J. ; Rombouts, P. ; Weyten, L.
Author_Institution :
Electron. & Inf. Syst., Ghent Univ., Belgium
Abstract :
This paper describes a general model for static as well as dynamic errors in multibit unit element DAC´s. Apart from the static mismatch there are two error terms arising from switching imperfections. Based on the model, some bandpass mismatch shaping techniques are presented. These address both the static mismatch as well as the switching imperfections. The technique can significantly improve the in band noise.
Keywords :
circuit analysis computing; circuit noise; digital-analogue conversion; errors; switching transients; bandpass mismatch shaping; bandpass unit element; dynamic errors; general model; in band noise; multibit DAC; static errors; static mismatch; switching imperfections; Continuous time systems; Logic; Multi-stage noise shaping; Performance analysis; Shape; Tin;
Conference_Titel :
Circuits and Systems, 2004. ISCAS '04. Proceedings of the 2004 International Symposium on
Print_ISBN :
0-7803-8251-X
DOI :
10.1109/ISCAS.2004.1328202