Title :
A floating-gate DAC array
Author :
Serrano, G. ; Hasler, P.
Author_Institution :
Dept. of Electr. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
The precision of digital-to-analog converters (DAC) is always limited by element mismatching. These elements can be transistors, resistors, capacitors, etc. Techniques used to improve resolution often involve the sacrifice of die area. In this paper we present a design for a DAC using floating-gate MOS transistors. This approach takes the classical scaled transistor DAC techniques, where we scale our transistors by programming each transistor´s floating-gate charge instead of W/L ratios. The programming eliminates device mismatch issues on DAC performance, and greatly reduces it size. A floating-gate digital-to-analog converter (FGDAC) that just occupies 37.25μm by 18.5μm area, was fabricated using 0.6μm CMOS technology. Because of its small size, an array of FGDACs can be built in a single IC; a 4×4 10 bit FGDAC has been fabricated using 0.6μm CMOS technology. Measurements show that we can obtain 7 bits of accuracy with less than 0.5LSB linearity error for a single FGDAC.
Keywords :
CMOS logic circuits; digital-analogue conversion; 0.6 microns; CMOS technology; MOS transistors; capacitors; die area; element mismatch; floating-gate DAC array; floating-gate charge; linearity error; resistors; resolution improvement; scaled transistor DAC; single IC; CMOS technology; Circuits; Digital-analog conversion; Linearity; MOS capacitors; MOSFETs; Nonvolatile memory; Resistors; Switches; Voltage;
Conference_Titel :
Circuits and Systems, 2004. ISCAS '04. Proceedings of the 2004 International Symposium on
Print_ISBN :
0-7803-8251-X
DOI :
10.1109/ISCAS.2004.1328205