Title :
A technique to deskew differential PCB traces
Author :
Atrash, Amer Hani ; Butka, Brian
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
A technique for deskewing a pair of terminated, differential PCB traces has been developed and fabricated in 0.25 μm CMOS technology. The deskewing system utilizes a delay-locked-loop with a digital counter-controlled delay line to match the delay through the positive and negative traces. Time domain reflectometry is used to measure the delay from the terminating resistor to the transmitting chip. The core circuitry occupies 588 μm×235 μm. Simulation results indicate that skews of over 1 ns can be eliminated using this technique.
Keywords :
CMOS digital integrated circuits; counting circuits; delay lines; delay lock loops; integrated circuit design; printed circuits; 0.25 micron; 1 ns; CMOS technology; core circuitry; delay locked loop; deskew differential PCB traces; digital counter controlled delay line; negative traces; positive traces; time domain reflectometry; Added delay; CMOS technology; Counting circuits; Data communication; Delay effects; Delay lines; Distortion; Microstrip; Reflectometry; Resistors;
Conference_Titel :
Circuits and Systems, 2004. ISCAS '04. Proceedings of the 2004 International Symposium on
Print_ISBN :
0-7803-8251-X
DOI :
10.1109/ISCAS.2004.1329334
