Title :
An error pattern ROM compression method for continuous data
Author :
Yang, Byung-Do ; Kim, Lee-Sup
Author_Institution :
Dept. of EECS, KAIST, Daejeon, South Korea
Abstract :
This paper proposes a new error pattern ROM (EP-ROM) compression method for continuous data. The EP-ROM reduces the ROM size by dividing the continuous data into coarse values and their errors and by storing the indices of error patterns instead of the errors. This method significantly reduces the ROM size by exploiting the characteristic that the errors for continuous data possess the same patterns. The experiment results show that the EP-ROM achieves 60∼77% ROM size reductions for various continuous data.
Keywords :
data compression; errors; read-only storage; ROM size reduction; continuous data; error pattern ROM compression method; Digital signal processors; Energy consumption; Logic; Mathematics; Power dissipation; Quantization; Read only memory; Very large scale integration;
Conference_Titel :
Circuits and Systems, 2004. ISCAS '04. Proceedings of the 2004 International Symposium on
Print_ISBN :
0-7803-8251-X
DOI :
10.1109/ISCAS.2004.1329404