Title :
TEM mode excitation and detection in FDTD analysis
Author :
Young, Jeffrey L. ; Adam, Ryan S.
Author_Institution :
Dept. of Electr. & Comput. Eng., Idaho Univ., Moscow, ID, USA
Abstract :
A large class of electromagnetic problems, suitable for numerical analysis, is the class consisting of N-port networks where each port has a defined terminal and source plane on some transmission line or waveguide. A typical method for exciting the electromagnetic field at the source plane is to place a soft or hard source in the vicinity of the conductors that form the waveguide. These sources are designed and placed to excite the dominant mode. For open structures like microstrips, the line sources also excite surface and radiation waves. We show, in this paper, that impressed electric and magnetic surface currents on the source plane can be designed to couple exclusively to the mode of interest.
Keywords :
computational electromagnetics; finite difference time-domain analysis; microstrip circuits; multiport networks; transmission line theory; waveguide theory; EM numerical analysis; FDTD analysis; N-port networks; TEM mode detection; TEM mode excitation; defined port terminal; electromagnetic field excitation; impressed electric surface currents; magnetic surface currents; microstrip line sources; microstrip structures; port source plane; radiation waves; surface waves; transmission line; waveguide; Conductors; Electromagnetic fields; Electromagnetic scattering; Electromagnetic waveguides; Finite difference methods; Microstrip; Numerical analysis; Planar waveguides; Time domain analysis; Transmission lines;
Conference_Titel :
Antennas and Propagation Society International Symposium, 2004. IEEE
Print_ISBN :
0-7803-8302-8
DOI :
10.1109/APS.2004.1329742