DocumentCode
418827
Title
Transmission of an evanescent wave through a subwavelength aperture in a PEC screen
Author
Petersson, L. E Rickard ; Smith, Glenn S.
Author_Institution
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Volume
4
fYear
2004
fDate
20-25 June 2004
Firstpage
4551
Abstract
The diffraction of a wave by an aperture in a plane screen is an old and fundamental problem in optics and electromagnetic theory. In a typical theoretical formulation for the electromagnetics problem, a circular aperture is placed in a perfectly conducting (PEC) plane screen of infinitesimal thickness lying in the xy plane. The incident field is a time-harmonic plane wave propagating in a direction lying in the xz plane. This case is referred to as the transverse-electric (TE) case because the incident electric field is normal to the plane of incidence (the plane determined by the normal to the screen and the direction of propagation). For the transverse-magnetic case (TM), the incident magnetic field is normal to the plane of incidence. The objective of an analysis is often to determine the total time-average power transmitted through the aperture, and a convenient parameter for quantifying it is the transmission coefficient. We consider two fundamental questions: what is the transmission coefficient for an evanescent plane wave through an electrically small aperture? can the transmission coefficient for an evanescent plane wave be significantly greater than that for a propagating plane wave? The paper aims to answer both of these questions.
Keywords
electromagnetic field theory; electromagnetic wave diffraction; electromagnetic wave transmission; PEC screen; TE wave; TM wave; electromagnetic theory; evanescent wave transmission; optics; perfectly conducting screen; subwavelength aperture; time-average power; time-harmonic plane wave; transmission coefficient; transverse-electric wave; transverse-magnetic wave; wave diffraction; Apertures; Electromagnetic diffraction; Electromagnetic propagation; Electromagnetic scattering; Magnetic analysis; Magnetic fields; Optical diffraction; Optical propagation; Optical surface waves; Tellurium;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium, 2004. IEEE
Print_ISBN
0-7803-8302-8
Type
conf
DOI
10.1109/APS.2004.1330365
Filename
1330365
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