Ultra-wideband (UWB) incidence on multiple dielectric interfaces

Author

Heidary, Kaveh

Author_Institution

Dept. of Electr. Eng., Alabama A&M Univ., Normal, AL, USA

Volume

2

fYear

2004

fDate

20-25 June 2004

Firstpage

1315

Abstract

The problem of a pulsed short-duration ultra-wideband (UWB) electromagnetic field incident on a multiple-layer lossy dielectric wall is considered. The electromagnetic fields are computed utilizing both frequency-domain (FFT) and finite-difference time-domain (FDTD) formalisms. Computed results, pertaining to internal and external EM fields, based on FFT and FDTD formulations are compared. The effects of layer thickness and material composition on the reflected and transmitted EM pulse are analyzed. The application of UWB technology to nondestructive testing (NDT) and evaluation of multilayer structures is discussed.

Keywords

electromagnetic fields; electromagnetic wave reflection; electromagnetic wave transmission; fast Fourier transforms; finite difference time-domain analysis; multilayers; nondestructive testing; FDTD analysis; FFT; NDT; UWB electromagnetic field; external EM fields; finite-difference time-domain analysis; frequency-domain analysis; internal EM fields; layer thickness; material composition; multilayer structures; multiple dielectric interfaces; multiple-layer lossy dielectric wall; nondestructive testing; pulsed short-duration electromagnetic field; reflected EM pulse; transmitted EM pulse; ultra-wideband electromagnetic field; Composite materials; Dielectric losses; Dielectric materials; EMP radiation effects; Electromagnetic fields; Finite difference methods; Frequency domain analysis; Nondestructive testing; Time domain analysis; Ultra wideband technology;

fLanguage

English

Publisher

ieee

Conference_Titel

Antennas and Propagation Society International Symposium, 2004. IEEE

Print_ISBN

0-7803-8302-8

Type

conf

DOI

10.1109/APS.2004.1330427

Filename

1330427