Title :
Uncalibrated two-view metrology
Author :
Liang, Bojian ; Chen, Zezhi ; Pears, Nick
Author_Institution :
Dept. of Comput. Sci., York Univ., UK
Abstract :
A method of visual metrology from uncalibrated cameras is proposed in this paper, whereby a camera, which captures two images separated by a (near) pure translation, becomes a height measurement device. A novel projective construction allows accurate affine height measurements to be made relative to a reference plane, given that the reference plane planar homography between the two views can be accurately recovered. To this end a planar homography estimation method is presented, which is highly accurate and robust and based on a novel reciprocal-polar (RP) image rectification. The absolute height of any pixel or feature above the reference plane can be obtained from this affine height once the camera´s distance to the reference plane, or the height of a second measurement in the image is specified. Results from our data show a mean absolute error of 6.9 mm and with two outliers removed this falls to 1.5 mm.
Keywords :
cameras; height measurement; image motion analysis; image reconstruction; matrix algebra; height measurement device; image separation; matrix algebra; planar homography estimation method; reciprocal polar image rectification; reference plane planar homography; uncalibrated cameras; uncalibrated two-view metrology; visual metrology; Cameras; Computer science; Image sequences; Layout; Metrology; Motion estimation; Phase estimation; Pixel; Robustness; Yield estimation;
Conference_Titel :
Pattern Recognition, 2004. ICPR 2004. Proceedings of the 17th International Conference on
Print_ISBN :
0-7695-2128-2
DOI :
10.1109/ICPR.2004.1334016