DocumentCode :
419722
Title :
Dense stereo matching using kernel maximum likelihood estimation
Author :
Jagmohan, A. ; Singh, M. ; Ahuja, N.
Author_Institution :
Illinois Univ., Urbana, IL, USA
Volume :
3
fYear :
2004
fDate :
23-26 Aug. 2004
Firstpage :
28
Abstract :
There has been much interest, recently, in the use of Bayesian formulations for solving image correspondence problems. For the two-view stereo matching problem, typical Bayesian formulations model the disparity prior as a pairwise Markov random field (MRF). Approximate inference algorithms for MRFs, such as graph cuts or belief propagation, treat the stereo matching problem as a labelling problem yielding discrete valued disparity estimates. In this paper, we propose a novel robust Bayesian formulation based on the recently proposed kernel maximum likelihood (KML) estimation framework. The proposed formulation uses probability density kernels to infer the posterior probability distribution of the disparity values. We present an efficient iterative algorithm, which uses a variational approach to form a KML estimate from the inferred distribution. The proposed algorithm yields continuous-valued disparity estimates, and is provably convergent. The proposed approach is validated on standard stereo pairs, with known sub-pixel disparity ground-truth data.
Keywords :
Bayes methods; graph theory; image matching; iterative methods; maximum likelihood estimation; random processes; statistical distributions; stereo image processing; variational techniques; belief propagation; continuous valued disparity estimate; dense stereo image matching; discrete valued disparity estimate; graph cuts; inference algorithms; iterative algorithm; kernel maximum likelihood estimation; pairwise Markov random field; posterior probability distribution; probability density kernels; robust Bayesian formulation; variational method; Bayesian methods; Belief propagation; Inference algorithms; Iterative algorithms; Kernel; Labeling; Markov random fields; Maximum likelihood estimation; Robustness; Yield estimation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition, 2004. ICPR 2004. Proceedings of the 17th International Conference on
ISSN :
1051-4651
Print_ISBN :
0-7695-2128-2
Type :
conf
DOI :
10.1109/ICPR.2004.1334461
Filename :
1334461
Link To Document :
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