Title :
Pulsed-Laser Testing for Single-Event Effects Investigations
Author :
Buchner, Stephen P. ; Miller, Florent ; Pouget, V. ; McMorrow, Dale P.
Author_Institution :
Naval Res. Lab., Washington, DC, USA
Abstract :
The application of pulsed lasers to the study of Single-Event Effects (SEEs) in integrated circuits and devices is described. The role of a pulsed laser is to provide spatial and temporal information about SEEs, information that is not available when broad-beam ion sources are used. A detailed description is given of the mechanisms involved, including light propagation and absorption by both linear and non-linear processes. Numerous examples highlight the versatility and usefulness of the technique in the study of SEEs.
Keywords :
integrated circuits; ion beam effects; laser beam effects; light absorption; light propagation; broad beam ion source; integrated circuits; light absorption; light propagation; pulsed laser testing; single event effects; spatial information; temporal information; Absorption; Laser beams; Lenses; Silicon; Surface emitting lasers; Testing; Heavy ions; pulse laser; single-event effects; test circuits;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2013.2255312
