• DocumentCode
    41993
  • Title

    Pulsed-Laser Testing for Single-Event Effects Investigations

  • Author

    Buchner, Stephen P. ; Miller, Florent ; Pouget, V. ; McMorrow, Dale P.

  • Author_Institution
    Naval Res. Lab., Washington, DC, USA
  • Volume
    60
  • Issue
    3
  • fYear
    2013
  • fDate
    Jun-13
  • Firstpage
    1852
  • Lastpage
    1875
  • Abstract
    The application of pulsed lasers to the study of Single-Event Effects (SEEs) in integrated circuits and devices is described. The role of a pulsed laser is to provide spatial and temporal information about SEEs, information that is not available when broad-beam ion sources are used. A detailed description is given of the mechanisms involved, including light propagation and absorption by both linear and non-linear processes. Numerous examples highlight the versatility and usefulness of the technique in the study of SEEs.
  • Keywords
    integrated circuits; ion beam effects; laser beam effects; light absorption; light propagation; broad beam ion source; integrated circuits; light absorption; light propagation; pulsed laser testing; single event effects; spatial information; temporal information; Absorption; Laser beams; Lenses; Silicon; Surface emitting lasers; Testing; Heavy ions; pulse laser; single-event effects; test circuits;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2013.2255312
  • Filename
    6510515
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=41993