Title :
WMG: Measurement methods for the broadband characterization of dielectric substrates
Author_Institution :
NIST
Abstract :
Provides an abstract of the workshop presentation and a brief professional biography of the presenter. The complete presentation was not made available for publication as part of the conference proceedings.
Conference_Titel :
Microwave Symposium Digest, 2004 IEEE MTT-S International
Conference_Location :
Fort Worth, TX, USA
Print_ISBN :
0-7803-8331-1
DOI :
10.1109/MWSYM.2004.1335943
