DocumentCode :
420148
Title :
WMJ: Statistical methods and analysis for microwave measurements
Author :
Williams, Doug ; Ridler, Nick ; Arz, Uwe
Author_Institution :
NIST
Volume :
1
fYear :
2004
fDate :
6-11 June 2004
Abstract :
Provides an abstract of the workshop presentation and a brief professional biography of the presenter. The complete presentation was not made available for publication as part of the conference proceedings.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2004 IEEE MTT-S International
Conference_Location :
Fort Worth, TX, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-8331-1
Type :
conf
DOI :
10.1109/MWSYM.2004.1335946
Filename :
1335946
Link To Document :
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