DocumentCode
420148
Title
WMJ: Statistical methods and analysis for microwave measurements
Author
Williams, Doug ; Ridler, Nick ; Arz, Uwe
Author_Institution
NIST
Volume
1
fYear
2004
fDate
6-11 June 2004
Abstract
Provides an abstract of the workshop presentation and a brief professional biography of the presenter. The complete presentation was not made available for publication as part of the conference proceedings.
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 2004 IEEE MTT-S International
Conference_Location
Fort Worth, TX, USA
ISSN
0149-645X
Print_ISBN
0-7803-8331-1
Type
conf
DOI
10.1109/MWSYM.2004.1335946
Filename
1335946
Link To Document