DocumentCode :
420152
Title :
High-Q evanescent-mode filters using silicon micromachining and polymer stereolithography (SL) processing
Author :
Gong, Xun ; Margomenos, Alex ; Liu, Bosui ; Chappell, William J. ; Katehi, Linda P B
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
Volume :
2
fYear :
2004
fDate :
6-11 June 2004
Firstpage :
433
Abstract :
Evanescent-mode filters are realized by both silicon micromachining as well as layer-by-layer polymer stereolithography (SL) processing. Capacitive loading an enclosed resonator reduces the size of a distributed cavity to be much smaller than a wavelength but which has much higher unloaded Q than lumped elements. The loaded resonators are extended into reduced-size filters with a low insertion loss due to the relatively high quality factor. Size reduction of resonators and filters can be a full order of magnitude depending on the height of the capacitive post. A 14 GHz resonator micro-machined in silicon with 5 mm×5 mm×0.45 mm volume reduces the size by 76.8%. The polymer-based fabrication was used to create a resonator with a Q greater than 1,050. An insertion loss of 0.83 dB was measured in a 1.69% filter with a size reduction of 47%. Furthermore, the proposed filters are quasi-planar and capable of integration with other RF components.
Keywords :
Q-factor; cavity resonator filters; elemental semiconductors; micromachining; microstrip resonators; microwave filters; polymers; silicon; stereolithography; 0.83 dB; 14 GHz; RF component integration; Si; capacitive loading; cavity resonator; high quality factor resonator; high-Q evanescent-mode filters; insertion loss; polymer stereolithography processing; polymer-based fabrication; quasiplanar filters; reduced-size filter; silicon micromachining; Fabrication; Insertion loss; Loss measurement; Micromachining; Polymers; Q factor; Resonator filters; Silicon; Size measurement; Stereolithography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2004 IEEE MTT-S International
ISSN :
0149-645X
Print_ISBN :
0-7803-8331-1
Type :
conf
DOI :
10.1109/MWSYM.2004.1336002
Filename :
1336002
Link To Document :
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