DocumentCode :
420160
Title :
Layer-by-layer polymer stereolithography fabrication for three-dimensional RF components
Author :
Liu, Bosui ; Gong, Xun ; Chappell, William J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Volume :
2
fYear :
2004
fDate :
6-11 June 2004
Firstpage :
481
Abstract :
Stereolithography (SL) is used innovatively to build high aspect ratio, complicated structures for RF components embedded inside of a package. The layer-by-layer additive laser-based process creates truly three-dimensional structures as opposed to more common two and a half dimension processes such as LTCC. High frequency embedded resonators are fabricated by the SL process to study the fabrication tolerance, effect of imperfections, and metal loss. The dimensional tolerance of this process is found to be 0.187%, which closely matches the variation in the measured resonators´ frequencies, 0.156%. The unloaded Q of the resonators is measured at 3005. As an example application of the three-dimensional fabrication process, a two-pole filter made from SL process is demonstrated with an insertion loss of only 0.287 dB for a 1.83% BW centered at 19.522 GHz. The low-loss performance of the structures indicates that the laser-based process is suitable for the integration of high frequency and high-Q three-dimensional structures within a package.
Keywords :
Q-factor; band-pass filters; cavity resonator filters; coplanar waveguides; copper; electroplating; laser beam effects; microwave filters; polymerisation; polymers; stereolithography; 0.287 dB; 19.522 GHz; LTCC; Q-factor; high frequency embedded resonators; insertion loss; laser-based process; layer-by-layer polymer stereolithography fabrication; metal loss; three-dimensional RF components; three-dimensional structures; two pole filter; Frequency measurement; Insertion loss; Optical device fabrication; Packaging; Polymers; Q measurement; Radio frequency; Resonant frequency; Resonator filters; Stereolithography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2004 IEEE MTT-S International
ISSN :
0149-645X
Print_ISBN :
0-7803-8331-1
Type :
conf
DOI :
10.1109/MWSYM.2004.1336017
Filename :
1336017
Link To Document :
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