• DocumentCode
    420165
  • Title

    Analysis of uniplanar electromagnetic band-gap (EBG) structures by the MoM/BI-RME method

  • Author

    Bozzi, Maurixio ; Germani, Simone ; Minelli, Leonardo ; Perregrini, Luca ; De Maagt, Peter

  • Author_Institution
    Dept. of Electron., Pavia Univ., Italy
  • Volume
    2
  • fYear
    2004
  • fDate
    6-11 June 2004
  • Firstpage
    515
  • Abstract
    This paper presents a novel method for the characterization of uniplanar electromagnetic band-gap structures. Their characterization requires the calculation of the dispersion diagram of the guided modes and the phase of the reflection coefficient under plane-wave illumination. The reflection coefficient is determined by using the MoM/BI-RME method. The same method is adopted in conjunction with a new technique for the efficient calculation of the dispersion diagram. This technique is based on the tracking of the eigenvalue path in the complex plane, and proved more reliable than the method based on the searching of the determinant zeros. The method is applied to the analysis of the classical Uniplanar Compact Electromagnetic Band-Gap structure, and some results show the accuracy of the method, its efficiency, and its convergence properties.
  • Keywords
    band structure; boundary integral equations; dielectric materials; eigenvalues and eigenfunctions; energy gap; method of moments; permittivity; boundary integral-resonant mode expansion method; convergence properties; dielectric constant; dispersion diagram; efficient calculation; eigenvalues and eigenfunctions; electromagnetic band-gap structures; guided mode; method of moments; plane wave illumination; reflection coefficient; tracking; Dielectric substrates; Eigenvalues and eigenfunctions; Electromagnetic analysis; Electromagnetic reflection; Integral equations; Lighting; Message-oriented middleware; Metamaterials; Periodic structures; Phased arrays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2004 IEEE MTT-S International
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-8331-1
  • Type

    conf

  • DOI
    10.1109/MWSYM.2004.1336027
  • Filename
    1336027