DocumentCode :
420434
Title :
A metric for assessing the degree of device nonlinearity and improving experimental design
Author :
Schreurs, Dominique ; Remley, Kate A. ; Williams, Dylan F.
Author_Institution :
Div. ESAT, Katholieke Univ., Leuven, Belgium
Volume :
2
fYear :
2004
fDate :
6-11 June 2004
Firstpage :
795
Abstract :
We propose a metric that quantifies the degree of nonlinearity of state-space trajectories for the purpose of improving the selection of collections of measurement data in the development of behavioral models. We illustrate the method with an off-the-shelf amplifier. We demonstrate the new sampling scheme with a measurement based model, and demonstrate that it quantitatively improves model accuracy.
Keywords :
microwave amplifiers; state-space methods; transmission line theory; RMS metric; amplifier; behavioral models; device nonlinearity; measurement data collections; state-space trajectories; Design for experiments; Inspection; NIST; Noise measurement; Nonlinear distortion; Radio frequency; Radiofrequency amplifiers; Sampling methods; Transmission lines; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2004 IEEE MTT-S International
ISSN :
0149-645X
Print_ISBN :
0-7803-8331-1
Type :
conf
DOI :
10.1109/MWSYM.2004.1339083
Filename :
1339083
Link To Document :
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