Title :
A metric for assessing the degree of device nonlinearity and improving experimental design
Author :
Schreurs, Dominique ; Remley, Kate A. ; Williams, Dylan F.
Author_Institution :
Div. ESAT, Katholieke Univ., Leuven, Belgium
Abstract :
We propose a metric that quantifies the degree of nonlinearity of state-space trajectories for the purpose of improving the selection of collections of measurement data in the development of behavioral models. We illustrate the method with an off-the-shelf amplifier. We demonstrate the new sampling scheme with a measurement based model, and demonstrate that it quantitatively improves model accuracy.
Keywords :
microwave amplifiers; state-space methods; transmission line theory; RMS metric; amplifier; behavioral models; device nonlinearity; measurement data collections; state-space trajectories; Design for experiments; Inspection; NIST; Noise measurement; Nonlinear distortion; Radio frequency; Radiofrequency amplifiers; Sampling methods; Transmission lines; Voltage;
Conference_Titel :
Microwave Symposium Digest, 2004 IEEE MTT-S International
Print_ISBN :
0-7803-8331-1
DOI :
10.1109/MWSYM.2004.1339083