Compact dictionaries for diagnosis of unmodeled faults in scan-BIST

Author

Liu, Chunsheng ; Dwarakanath, Kumar N. ; Chakrabarty, Krishnendu ; Blanton, Ronald D Shawn

Author_Institution

Dept. of Comput. & Electron. Eng., Nebraska Univ., Omaha, NE, USA

fYear

2004

fDate

19-20 Feb. 2004

Firstpage

173

Lastpage

178

Abstract

We address the problem of generating compact dictionaries for the diagnosis of unmodeled faults in scan-BIST. We present dictionary organization schemes that provide two orders of magnitude reduction in dictionary size with no significant loss in resolution, and facilitate the diagnosis of unmodeled faults. Experimental results for the ISCAS-89 benchmark circuits show that various types of unmodeled faults can be efficiently located using compact dictionaries generated for single stuck-at-faults.

Keywords

benchmark testing; boundary scan testing; built-in self test; fault simulation; logic testing; ISCAS-89 benchmark circuits; compact dictionaries; dictionary organization schemes; dictionary size; order of magnitude reduction; scan-BIST; single stuck-at-faults; unmodeled faults diagnosis; Automatic test pattern generation; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Compaction; Dictionaries; Electrical fault detection; Fault detection; Fault diagnosis;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI, 2004. Proceedings. IEEE Computer society Annual Symposium on

Print_ISBN

0-7695-2097-9

Type

conf

DOI

10.1109/ISVLSI.2004.1339526

Filename

1339526