DocumentCode

421085

Title

Advanced memory issues - Session 16

fYear

2004

fDate

3-6 Oct. 2004

Firstpage

337

Lastpage

337

Keywords

Delay; Error analysis; Failure analysis; Maintenance; Random access memory; Read-write memory; Testing; Timing; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Custom Integrated Circuits Conference, 2004. Proceedings of the IEEE 2004

Print_ISBN

0-7803-8495-4

Type

conf

DOI

10.1109/CICC.2004.1358814

Filename

1358814