• DocumentCode
    42135
  • Title

    Effect of Radiation on a Mach–Zehnder Interferometer Silicon Modulator for HL-LHC Data Transmission Applications

  • Author

    Seif El Nasr-Storey, Sarah ; Boeuf, Frederic ; Baudot, Charles ; Detraz, Stephane ; Fedeli, Jean Marc ; Marris-Morini, Delphine ; Olantera, Lauri ; Pezzullo, Giuseppe ; Sigaud, Christophe ; Soos, Csaba ; Troska, Jan ; Vasey, Francois ; Vivien, Laurent ; Z

  • Author_Institution
    Eur. Organ. for Nucl. Res. (CERN), Geneva, Switzerland
  • Volume
    62
  • Issue
    1
  • fYear
    2015
  • fDate
    Feb. 2015
  • Firstpage
    329
  • Lastpage
    335
  • Abstract
    High-speed Mach-Zehnder interferometer silicon modulators were irradiated with neutrons and X-rays in two separate radiation tests. The devices were exposed to a total fluence of 1.2 ×1015 neutrons/cm2 and a total ionizing dose of 1.3 MGy; levels comparable to the worst radiation levels for a tracking detector after 10 years of operation at the High-Luminosity LHC. Our measurements indicate that the devices´ performance does not significantly degrade after exposure to nonionizing radiation and begins to be affected by ionizing radiation after a dose of a few hundred kGy; the phase-shift for an applied reverse bias of 1 V is 10% of its preirradiated value after 600 kGy of received ionizing dose.
  • Keywords
    Mach-Zehnder interferometers; data communication; dosimetry; optical modulation; position sensitive particle detectors; radiation effects; silicon; silicon radiation detectors; HL-LHC data transmission applications; high-luminosity LHC; high-speed Mach-Zehnder interferometer silicon modulators; phase-shift; radiation effect; radiation levels; radiation tests; total ionizing dose; tracking detector; Detectors; Leakage currents; Modulation; Neutrons; Radiation effects; Silicon; X-rays; High-luminosity LHC (HL-LHC); optoelectronics; radiation damage; silicon photonics; total ionizing dose (TID);
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2015.2388546
  • Filename
    7027245