DocumentCode
421461
Title
Phase-sensitive electric-field-induced second-harmonic microscopic probe of electronic materials
Author
Wu, K. ; Carriles, R. ; Downer, M.C.
Author_Institution
Dept. of Phys., Texas Univ., Austin, TX, USA
Volume
2
fYear
2004
fDate
16-21 May 2004
Abstract
We demonstrate an electric-field-induced second-harmonic microscope that measures both amplitude and phase of imaged second-harmonic light with sub-micron spatial resolution, thus providing complete characterization of dc field variations near metal-semiconductor junctions.
Keywords
electric field effects; image resolution; optical harmonic generation; optical microscopes; semiconductor-metal boundaries; dc field variations; electric-field-induced second harmonic generation; electric-field-induced second harmonic microscope; electronic materials; metal-semiconductor junctions; microscopic imaging; phase-sensitive microscope probe; second-harmonic light; second-harmonic microscopic probe; sub-micron spatial resolution;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2004. (CLEO). Conference on
Conference_Location
San Francisco, CA
Print_ISBN
1-55752-777-6
Type
conf
Filename
1360653
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