DocumentCode
421545
Title
Single shot temporal characterization of sub-hundred femtosecond electron bunches at the SLAC SPPS experiment
Author
Cavalieri, A. ; Fritz, D.M. ; Lee, S.H. ; Schlarb, H. ; Bucksbaum, Philip H. ; Reis, D.A.
Author_Institution
SPPS Collaboration, Michigan Univ., Ann Arbor, MI, USA
Volume
2
fYear
2004
fDate
16-21 May 2004
Abstract
Electro-optic sampling (EOS) is used to temporally characterize compressed ultra-relativistic electron bunches at the Stanford linear accelerator center (SLAC). These electron bunches are used to produce ultrafast X-rays at the sub-picosecond pulse source experiment (SPPS).
Keywords
Pockels effect; X-ray lasers; X-ray production; free electron lasers; high-speed optical techniques; particle beam bunching; SLAC SPPS experiment; Stanford linear accelerator center; electrooptic sampling; single shot temporal characterization; subhundred femtosecond electron bunches; subpicosecond pulse source experiment; ultrafast X-rays; ultrarelativistic electron bunches;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2004. (CLEO). Conference on
Conference_Location
San Francisco, CA
Print_ISBN
1-55752-777-6
Type
conf
Filename
1360737
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