• DocumentCode
    42167
  • Title

    X-Ray Diffraction: New Eyes on the Process

  • Author

    Anderson, Jon ; De Andrade Gobbo, Luciano ; van Weeren, Harald

  • Author_Institution
    PANalytical, St. Laurent, QC, Canada
  • Volume
    51
  • Issue
    1
  • fYear
    2015
  • fDate
    Jan.-Feb. 2015
  • Firstpage
    20
  • Lastpage
    27
  • Abstract
    The X-ray diffraction (XRD) analysis of cement process materials has grown beyond its roots in the laboratory to become an important tool for process control. Combined with its partners, i.e., X-ray fluorescence (XRF) and controlled neutron analysis (CNA), these techniques can provide valuable process control information, i.e., essentially “new eyes”, to guide process control decisions. Important developments in XRD analyzers have decreased analysis time from hours to minutes to provide quick results that enable timely process control decisions. XRD phase analysis can provide information to optimize combustion control and mix chemistry, cooler operation, and additive mixtures in finish cement. This paper will provide an overview of all the XRF/XRD applications and then focus on the XRD process control opportunities.
  • Keywords
    X-ray diffraction; cements (building materials); process control; CNA; X-ray diffraction; X-ray fluorescence; XRD analysis; XRF; cement process materials; controlled neutron analysis; finish cement; process control decision; process control information; Correlation; Fly ash; Process control; Slag; X-ray diffraction; X-ray scattering; Amorphous; Rietveld refinement; X-ray diffraction (XRD); X-ray fluorescence (XRF); cement process control; clinker; neutron analysis; quality assurance; quality control;
  • fLanguage
    English
  • Journal_Title
    Industry Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-9994
  • Type

    jour

  • DOI
    10.1109/TIA.2014.2350557
  • Filename
    6882228