Title :
Measurement of broadband gain spectrum of semiconductor optical amplifiers using a two-section technique
Author :
Wu, Chao-Hsin ; Su, Yi-Shin ; Lin, Ching-Fuh
Author_Institution :
Graduate Inst. of Electro-Opt. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
A two-section technique is used to measure gain spectrum of semiconductor optical amplifiers. Without other external setup, broadband gain spectrum is measured for a spectral range of 290 nm with the gain of above 30 cm/sup -1/.
Keywords :
laser variables measurement; optical communication equipment; semiconductor optical amplifiers; broadband gain spectrum; gain profile; optical communication; semiconductor optical amplifiers; two-section technique;
Conference_Titel :
Lasers and Electro-Optics, 2004. (CLEO). Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
1-55752-777-6
