DocumentCode
421809
Title
Measurement of broadband gain spectrum of semiconductor optical amplifiers using a two-section technique
Author
Wu, Chao-Hsin ; Su, Yi-Shin ; Lin, Ching-Fuh
Author_Institution
Graduate Inst. of Electro-Opt. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Volume
1
fYear
2004
fDate
16-21 May 2004
Abstract
A two-section technique is used to measure gain spectrum of semiconductor optical amplifiers. Without other external setup, broadband gain spectrum is measured for a spectral range of 290 nm with the gain of above 30 cm/sup -1/.
Keywords
laser variables measurement; optical communication equipment; semiconductor optical amplifiers; broadband gain spectrum; gain profile; optical communication; semiconductor optical amplifiers; two-section technique;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2004. (CLEO). Conference on
Conference_Location
San Francisco, CA
Print_ISBN
1-55752-777-6
Type
conf
Filename
1361257
Link To Document