DocumentCode
421914
Title
Dember and photo-emf currents in Si photoconductive detectors
Author
Dikmelik, Yamaç ; Davidson, Prederic M.
Author_Institution
Dept. of Electr. & Comput. Eng., Johns Hopkins Univ., Baltimore, MD, USA
Volume
1
fYear
2004
fDate
16-21 May 2004
Abstract
Dember and photo-emf currents are investigated in silicon photoconductive detectors both theoretically and experimentally. Dember photocurrents were found to dominate the response of high-purity silicon samples to 852 nm light.
Keywords
Dember effect; photoconducting devices; photoconducting materials; photoconductivity; photodetectors; semiconductor devices; silicon; 852 nm; Dember photocurrents; Si; Si detectors; high-purity silicon samples; photoconductive detectors; photoelectromotive force; photoemf currents;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2004. (CLEO). Conference on
Conference_Location
San Francisco, CA
Print_ISBN
1-55752-777-6
Type
conf
Filename
1361371
Link To Document