Title :
Metrology system for space interferometry mission system testbed 3
Author :
Azizi, Alireza ; Alvarez-Salazar, Oscar ; Goullioud, Renaud ; Gursel, Yekta
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
A 3-baseline interferometer fourteen metrology gauges are used to monitor changes in the two baselines; calculate the length of the third. Simulation for estimating the third baseline indicates measurement capability better than 1 nm error.
Keywords :
aerospace instrumentation; astronomical techniques; distance measurement; length measurement; light interferometry; measurement by laser beam; 3-baseline interferometer fourteen metrology gauges; metrology system; space interferometry mission system testbed 3;
Conference_Titel :
Lasers and Electro-Optics, 2004. (CLEO). Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
1-55752-777-6
