• DocumentCode
    422010
  • Title

    Metrology system for space interferometry mission system testbed 3

  • Author

    Azizi, Alireza ; Alvarez-Salazar, Oscar ; Goullioud, Renaud ; Gursel, Yekta

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • Volume
    1
  • fYear
    2004
  • fDate
    16-21 May 2004
  • Abstract
    A 3-baseline interferometer fourteen metrology gauges are used to monitor changes in the two baselines; calculate the length of the third. Simulation for estimating the third baseline indicates measurement capability better than 1 nm error.
  • Keywords
    aerospace instrumentation; astronomical techniques; distance measurement; length measurement; light interferometry; measurement by laser beam; 3-baseline interferometer fourteen metrology gauges; metrology system; space interferometry mission system testbed 3;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics, 2004. (CLEO). Conference on
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    1-55752-777-6
  • Type

    conf

  • Filename
    1361474
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=422010