Title :
Damage of Sc/Si multilayer mirrors exposed to intense nanosecond 46.9 nm laser pulses
Author :
Vaschenko, G. ; Grisham, M. ; Menoni, C.S. ; Rocca, J.J. ; Pershyn, Yu.P. ; Zubarev, E.N. ; Voronov, D.L. ; Sevryukova, V.A. ; Kondratenko, V.V. ; Vinogradov, A.V. ; Artioukov, I.A.
Author_Institution :
Dept. of Electr. & Comput. Eng., Colorado State Univ., Fort Collins, CO, USA
Abstract :
The damage threshold fluence (/spl sim/ 0.08 J/cm/sup 2/) and damage mechanism of extreme ultraviolet Sc/Si multilayer coatings irradiated by 46.9 nm laser pulses of nanosecond duration are reported.
Keywords :
high-speed optical techniques; laser beam effects; mirrors; optical multilayers; scandium; silicon; 46.9 nm; Sc-Si; Sc/Si multilayer mirrors; damage threshold fluence; intense nanosecond laser pulse irradiation;
Conference_Titel :
Lasers and Electro-Optics, 2004. (CLEO). Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
1-55752-777-6
