Title :
Simplified inverse Fourier transform technique to determine second-order optical nonlinearity profiles using a reference sample
Author :
Ozcan, A. ; Digonnet, M.J.F. ; Kino, G.S.
Author_Institution :
Edward L. Ginzton Lab., Stanford Univ., CA, USA
Abstract :
A new technique to uniquely determine the nonlinearity profile of nonlinear thin films using a known reference sample is demonstrated. This method is simpler, faster, and experimentally easier to implement than earlier techniques.
Keywords :
Fourier transform optics; nonlinear optics; optical films; inverse Fourier transform technique; nonlinear thin films; nonlinearity profile determination; reference sample; second-order optical nonlinearity profile;
Conference_Titel :
Optical Fiber Communication Conference, 2004. OFC 2004
Conference_Location :
Los Angeles, CA, USA
Print_ISBN :
1-55752-772-5
