Title :
Optical sensors utilizing resonant modes in total reflection structures
Author :
Nelson, R.L. ; Haus, J.W. ; Birchfield, B. ; Hopkins, F.K. ; Grote, J.G.
Author_Institution :
Mater. & Manuf. Directorate, Air Force Res. Lab., Wright-Patterson AFB, OH, USA
Abstract :
This paper examines optical sensors that utilize the resonant modes within a Gires-Tournois interferometer. The sensor uses leaky wave type resonances present in structures composed of purely dielectric layers at the total internal reflection surface of a prism. This structure and experiment aims to test the refractive index sensitivity of the resonant structure which is due to the redistribution of the incident fields when the incident light is coincident with a resonance condition of the leaky wave structure.
Keywords :
cavity resonators; dielectric materials; image sensors; light interferometers; light reflection; optical prisms; optical resonators; optical sensors; refractive index; resonant states; Gires-Tournois interferometer; leaky wave structure; leaky wave type resonances; optical prism; optical sensors; purely dielectric layers; refractive index sensitivity; resonant modes; total internal reflection surface; total reflection structures; Force sensors; Optical films; Optical refraction; Optical scattering; Optical sensors; Optical variables control; Optimized production technology; Refractive index; Resonance; Temperature sensors;
Conference_Titel :
Lasers and Electro-Optics Society, 2004. LEOS 2004. The 17th Annual Meeting of the IEEE
Print_ISBN :
0-7803-8557-8
DOI :
10.1109/LEOS.2004.1363084
