DocumentCode
422724
Title
Design and implementation of self-testable full range window comparator
Author
Wong, Mike W T ; Zhang, Yubin
Author_Institution
Dept. of Electron. & Inf. Eng., Hong Kong Polytech. Univ., Kowloon, China
fYear
2004
fDate
2004
Firstpage
314
Lastpage
318
Abstract
This paper presents a new approach to implement a full range window comparator (FRWC) with self-testing capability. Detailed analysis of the proposed comparator circuit has shown that the overall design not only can achieve high fault coverage in the FRWC but also can detect or tolerate single fault in the self testing circuitry used.
Keywords
built-in self test; comparators (circuits); fault diagnosis; fault tolerance; integrated circuit design; mixed analogue-digital integrated circuits; network analysis; system-on-chip; circuit analysis; comparator circuit; fault detection; fault tolerance; high fault coverage; self testing circuitry; self-testable full range window comparator; Automatic testing; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Electrical fault detection; Fault detection; Inverters; Operational amplifiers; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium, 2004. 13th Asian
Conference_Location
Kenting, Taiwan
ISSN
1081-7735
Print_ISBN
0-7695-2235-1
Type
conf
DOI
10.1109/ATS.2004.35
Filename
1376577
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