Title :
Design and implementation of self-testable full range window comparator
Author :
Wong, Mike W T ; Zhang, Yubin
Author_Institution :
Dept. of Electron. & Inf. Eng., Hong Kong Polytech. Univ., Kowloon, China
Abstract :
This paper presents a new approach to implement a full range window comparator (FRWC) with self-testing capability. Detailed analysis of the proposed comparator circuit has shown that the overall design not only can achieve high fault coverage in the FRWC but also can detect or tolerate single fault in the self testing circuitry used.
Keywords :
built-in self test; comparators (circuits); fault diagnosis; fault tolerance; integrated circuit design; mixed analogue-digital integrated circuits; network analysis; system-on-chip; circuit analysis; comparator circuit; fault detection; fault tolerance; high fault coverage; self testing circuitry; self-testable full range window comparator; Automatic testing; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Electrical fault detection; Fault detection; Inverters; Operational amplifiers; Voltage;
Conference_Titel :
Test Symposium, 2004. 13th Asian
Conference_Location :
Kenting, Taiwan
Print_ISBN :
0-7695-2235-1
DOI :
10.1109/ATS.2004.35
