DocumentCode
424383
Title
Larger-than-Vdd Forward Body Bias in Sub-0.5V Nanoscale CMOS
Author
Ananthan, H. ; Kim, Chul Han ; Roy, Kaushik
Author_Institution
Purdue University, West Lafayette, IN
fYear
2004
fDate
11-11 Aug. 2004
Firstpage
8
Lastpage
13
Abstract
This paper examines the effectiveness of larger-than-Vdd forward body bias (FBB) in nanoscale bulk CMOS circuits where Vdd is expected to scale below 0.5V. Equal-to and larger-than Vdd FBB schemes offer unique advantages over conventional FBB such as simple design overhead and reverse body bias capability respectively. Compared to zero body bias, they improve process-variation immunity and achieve 71% and 78% standby leakage savings at iso performance and iso active power at room temperature. We also suggest a novel temperature-adaptive body bias scheme to control active leakage and achieve 22% and 40% active power savings at higher temperatures.
Keywords
Forward Body Bias; Junction Leakage; Process Variations; Sub-threshold Leakage; Forward Body Bias; Junction Leakage; Process Variations; Sub-threshold Leakage;
fLanguage
English
Publisher
ieee
Conference_Titel
Low Power Electronics and Design, 2004. ISLPED '04. Proceedings of the 2004 International Symposium on
Conference_Location
Newport Beach, CA, USA
Print_ISBN
1-58113-929-2
Type
conf
Filename
1382952
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