Title :
The Impact of Variability on Power
Author_Institution :
IBM Austin Research Laboratory, Austin, TX
Abstract :
The integrated circuit manufacturing process has inevitable imperfections and fluctuations that result in ever-growing systematic and random variations in the electrical parameters of active and passive devices fabricated. The impact of such variations on various aspects of chip performance has been the subject of numerous papers, and techniques for analyzing a d dealing with such variability -broadly labelled design for manufacturability are emerging as the next hot topic in this area.
Keywords :
Integrated Circuit; Power; Variability; Integrated Circuit; Power; Variability;
Conference_Titel :
Low Power Electronics and Design, 2004. ISLPED '04. Proceedings of the 2004 International Symposium on
Conference_Location :
Newport Beach, CA, USA
Print_ISBN :
1-58113-929-2
