• DocumentCode
    424792
  • Title

    The amplitude phase dynamics and fixed points in tapping-mode atomic force microscopy

  • Author

    Sebastian, Abu ; Gannepalli, Anil ; Salapaka, Murti V.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
  • Volume
    3
  • fYear
    2004
  • fDate
    June 30 2004-July 2 2004
  • Firstpage
    2499
  • Abstract
    The first harmonic of the cantilever deflection in the tapping-mode operation of an atomic force microscope (AFM) is analyzed using asymptotic methods for weakly nonlinear oscillators. The resulting amplitude and phase dynamical equations are obtained which characterize the transient behavior of tapping-mode dynamics. The steady state behavior is analyzed by examining the fixed points of the amplitude phase dynamics and a simple stability criterion is obtained. Further with a simple tip-sample interaction model, the experimentally observed discontinuous jumps in the amplitude versus tip-sample separation plots are explained and the regions of the interaction regime probed by the tip are investigated.
  • Keywords
    atomic force microscopy; oscillators; stability; amplitude phase dynamics; cantilever deflection; fixed points; simple stability criterion; simple tip-sample interaction model; steady state behavior; tapping-mode atomic force microscopy; transient behavior; weakly nonlinear oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, 2004. Proceedings of the 2004
  • Conference_Location
    Boston, MA, USA
  • ISSN
    0743-1619
  • Print_ISBN
    0-7803-8335-4
  • Type

    conf

  • Filename
    1383840