DocumentCode
424792
Title
The amplitude phase dynamics and fixed points in tapping-mode atomic force microscopy
Author
Sebastian, Abu ; Gannepalli, Anil ; Salapaka, Murti V.
Author_Institution
Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA
Volume
3
fYear
2004
fDate
June 30 2004-July 2 2004
Firstpage
2499
Abstract
The first harmonic of the cantilever deflection in the tapping-mode operation of an atomic force microscope (AFM) is analyzed using asymptotic methods for weakly nonlinear oscillators. The resulting amplitude and phase dynamical equations are obtained which characterize the transient behavior of tapping-mode dynamics. The steady state behavior is analyzed by examining the fixed points of the amplitude phase dynamics and a simple stability criterion is obtained. Further with a simple tip-sample interaction model, the experimentally observed discontinuous jumps in the amplitude versus tip-sample separation plots are explained and the regions of the interaction regime probed by the tip are investigated.
Keywords
atomic force microscopy; oscillators; stability; amplitude phase dynamics; cantilever deflection; fixed points; simple stability criterion; simple tip-sample interaction model; steady state behavior; tapping-mode atomic force microscopy; transient behavior; weakly nonlinear oscillators;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference, 2004. Proceedings of the 2004
Conference_Location
Boston, MA, USA
ISSN
0743-1619
Print_ISBN
0-7803-8335-4
Type
conf
Filename
1383840
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