DocumentCode
4251
Title
The Effect of Reworking Exam Problems on Problem-Solving Performance in a Circuit Analysis Course: An Exploratory Study
Author
Holmes, Archie L.
Author_Institution
Charles L. Brown Dept. of Electr. & Comput. Eng., Univ. of Virginia, Charlottesville, VA, USA
Volume
57
Issue
2
fYear
2014
fDate
May-14
Firstpage
107
Lastpage
111
Abstract
In foundational knowledge engineering courses, students engage in problem solving in order to learn important course concepts. To help in this process, students receive feedback on their performance from the instructor. This paper explores an alternative to instructor-provided feedback: a semi-structured assignment in which students reworked problems they failed to solve correctly on a midterm exam for credit. The assignment required students to provide a correct solution to the problem and identify both mathematical and conceptual errors made in the initial solution. The initial results show that students who completed this assignment were able to apply course concepts in analysis and reasoning questions more accurately than students who received exam feedback from the instructor. In addition, these students showed a marked improvement in their ability to solve problems common in a Circuit Analysis course. These results show that such semi-structured assignments can replace instructor-provided feedback in large-enrollment classes and lead to improved problem solving.
Keywords
cognition; educational courses; electronic engineering education; circuit analysis course; conceptual error identification; foundational knowledge engineering courses; instructor provided feedback; large enrollment class; mathematical error identification; problem solving performance; reworking exam problem; semi-structured assignment; Circuit analysis; Cognition; Educational institutions; Fading; Knowledge engineering; Materials; Problem-solving; Circuit analysis; feedback; metacognition; problem solving; self-regulated learning;
fLanguage
English
Journal_Title
Education, IEEE Transactions on
Publisher
ieee
ISSN
0018-9359
Type
jour
DOI
10.1109/TE.2013.2278818
Filename
6595146
Link To Document